Ultra wide voltage range consideration of reliability-aware STT magnetic flip-flop in 28 nm FDSOI technology
نویسندگان
چکیده
منابع مشابه
A new low power high reliability flip-flop robust against process variations
Low scaling technology makes a significant reduction in dimension and supply voltage, and lead to new challenges about power consumption such as increasing nodes sensitivity over radiation-induced soft errors in VLSI circuits. In this area, different design methods have been proposed to low power flip-flops and various research studies have been done to reach a suitable hardened flip-flops. In ...
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ورودعنوان ژورنال:
- Microelectronics Reliability
دوره 55 شماره
صفحات -
تاریخ انتشار 2015